Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
Y. Sun, Yichuang Sun
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
Categories:
Year:
2007
Publisher:
IET
Language:
english
Pages:
411
ISBN 10:
0863417450
ISBN 13:
9780863417450
Series:
Circuits, Devices and Systems
File:
PDF, 3.27 MB
IPFS:
,
english, 2007